The EMMA device is an X-Ray Diffraction (XRD) system designed and manufactured by GBC Scientific Equipment. This instrument is used for analyzing and identifying crystalline structures in various samples.

Main Features of the EMMA Device:

1. High precision in XRD analysis: The device provides accurate information about crystal structures, grain size, internal stresses, and material phases.

2. X-ray source: It uses a high-quality X-ray tube capable of producing adjustable energy beams.

3. Flexible design: Typically modular, allowing upgrades by adding accessories to enhance performance for specific applications.

4. Applications: Phase identification, crystal structure determination, polymorphism studies in pharmaceuticals, and analysis of stress and crystal defects.

5. User interface: The accompanying software usually features a user-friendly environment for easy processing and analysis of XRD data.

GBC Scientific Equipment is a reputable manufacturer of analytical and scientific instruments, producing a variety of devices including Atomic Absorption Spectrometers (AAS), UV-Vis Spectrophotometers, and XRD systems like EMMA.

EMMA is a specialized XRD system designed for detailed crystalline structure analysis of materials. It is widely used in materials science, metallurgy, chemistry, solid-state physics, and pharmaceutical research. Below are more technical details:

Structure and Function:

1. X-ray Source:

Uses high-power X-ray tubes, commonly copper or cobalt, to generate specific wavelengths.

Voltage and current can be adjusted to control beam intensity and energy.

2. Advanced Optical System:

Equipped with a monochromator to filter unwanted wavelengths and enhance data quality.

Optics designed to reduce noise and increase signal-to-noise ratio.

3. Detector:

Uses advanced detectors such as Position Sensitive Detectors or Solid State Detectors for precise diffraction pattern recording.

Capable of rapid data acquisition for time-consuming and precise analyses.

4. Goniometer:

Precise rotary goniometer (Theta/2Theta design) for accurate adjustment of incident and diffracted beam angles.

Suitable for precise angular scans and crystal parameter measurements.

5. Data Analysis:

Equipped with advanced software for diffraction pattern analysis, phase identification, and grain size determination.

Compatible with standard databases like ICDD PDF-2 for phase recognition.

Specialized Applications:

1. Phase Identification:

Detects crystalline and amorphous materials.

Determines phase percentages in multiphase samples.

2. Crystal Lattice Parameter Measurement:

Determines unit cell dimensions and distortions caused by internal stresses.

3. Crystalline Texture Analysis:

Examines preferred crystal orientations in polycrystalline materials.

4. Residual Stress Analysis:

Measures internal stresses in metals and ceramics.

5. Pharmaceutical Structure Analysis:

Studies polymorphism and identifies different phases in drug compounds.

Design and Performance Features:

Modular design: Allows addition of accessories like cooling systems for stable operation.

High sensitivity: Suitable for low-volume samples and low-contrast materials.

Fast scanning: Ideal for rapid measurements in industrial and research applications.

Limitations:

Requires precise calibration for very sensitive data.

Limited use for amorphous (non-crystalline) materials.

Sample quality is critical; contamination or heterogeneity may affect results.

EMMA Configuration Options:

Pre-configured and interchangeable optics:

Standard slit optics

Polycapillary optics

Flat waveguide X-ray resonators

Detector options:

Proportional Xenon detector with graphite monochromator

Parallel beam or thin film detector

Dual or branched arm

Multi-strip solid-state detector (MtriX)

Stages:

Standard stage

Long sample stage

Rotary stage

Fine rotary stage

High-temperature stage (PAAR HTK-16)

Low-temperature stage (PAAR TTK-450)

Eulerian cradle